NDE Reliability and Process Control for Structural Ceramics

[+] Author and Article Information
G. Y. Baaklini

NASA Lewis Research Center, Cleveland, OH 44135

J. Eng. Gas Turbines Power 109(3), 263-266 (Jul 01, 1987) (4 pages) doi:10.1115/1.3240034 History: Received January 30, 1987; Online October 15, 2009


The reliability of microfocus x-radiography and scanning laser acoustic microscopy for detecting microvoids in silicon nitride and silicon carbide was statistically evaluated. Materials and process-related parameters that influenced the statistical findings in research samples are discussed. The use of conventional x-radiography in controlling and optimizing the processing and sintering of an Si3 N4 -SiO2 -Y2 O3 composition designated NASA 6Y is described. Radiographic evaluation and guidance helped develop uniform high-density Si3 N4 modulus-of-rupture bars with improved four-point flexural strength (857, 544, and 462 MPa at room temperature, 1200°C, and 1370°C, respectively) and reduced strength scatter.

Copyright © 1987 by ASME
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