Thin Film Conducting and Semiconducting Resistance Thermometers for Surface Temperature Measurement

[+] Author and Article Information
R. J. Hannemann

Bell Laboratories, Whippany, N. J.

J. Eng. Power 99(3), 385-390 (Jul 01, 1977) (6 pages) doi:10.1115/1.3446508 History: Received July 30, 1976; Online July 14, 2010


The accurate determination of surface temperatures, especially during high conductance processes such as condensation or boiling, without affecting the heat transfer phenomena under study, is a challenging experimental task. The present work describes the fabrication and characteristics of two unique types of surface thermometers produced using microelectronic thin film technology. One uses titanium in a meandering pattern to measure surface average temperatures, while the other, using germanium, was designed for point measurements and rapid transient response. An application to experiments involving dropwise condensation of steam is considered in detail.

Copyright © 1977 by ASME
Your Session has timed out. Please sign back in to continue.





Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging and repositioning the boxes below.

Related Journal Articles
Related eBook Content
Topic Collections

Sorry! You do not have access to this content. For assistance or to subscribe, please contact us:

  • TELEPHONE: 1-800-843-2763 (Toll-free in the USA)
  • EMAIL: asmedigitalcollection@asme.org
Sign In