0
RESEARCH PAPERS

Evaluation of Portable Optical Property Measurement Equipment for Solar Selective Surfaces

[+] Author and Article Information
R. B. Pettit

Sandia Laboratories, Albuquerque, N. Mex. 87185

J. Eng. Power 100(4), 489-496 (Oct 01, 1978) (8 pages) doi:10.1115/1.3446384 History: Received August 23, 1977; Online July 14, 2010

Abstract

The operation and accuracy of portable optical measurement equipment for determining the solar absorptance, αs , and emittance, ε, of solar selective surfaces are presented. The optical equipment includes a Gier Dunkle Solar Reflectometer (Model MS-251) and a Willey Alpha Meter (Model 2150) for αs measurements and a Gier Dunkle Infrared Reflectometer (Model DB-100) and a Willey Ambient Emissometer (Model 2158) for ε measurements. The accuracy of the MS-251 for measurements of αs for electrodeposited black chrome coatings was determined to be better than ±0.03 absorptance units. For the same coatings, the Willey Alpha Meter accuracy was limited by deviations up to 0.11 absorptance units. The accuracy of the Gier Dunkle Infrared Reflectometer for ε(100°C) measurements is better than ±0.02 emittance units. Values for ε(100°C) determined with the Willey Emissometer using black chrome coatings are higher than the actual 100°C emittance. However, since the relationship is linear, the correct emittance can be calculated by multiplication by a constant factor.

Copyright © 1978 by ASME
Your Session has timed out. Please sign back in to continue.

References

Figures

Tables

Errata

Discussions

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging and repositioning the boxes below.

Related Journal Articles
Related eBook Content
Topic Collections

Sorry! You do not have access to this content. For assistance or to subscribe, please contact us:

  • TELEPHONE: 1-800-843-2763 (Toll-free in the USA)
  • EMAIL: asmedigitalcollection@asme.org
Sign In