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Thermal Metrology at Micro/Nanoscales
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Proceedings Papers

Fine Temperature Measurement and Fabrication of On-Chip Whispering-Gallery Mode Micro-Sensors

Matthew Frenkel, Marlon Avellan, Zhixiong Guo
Proc. ASME. MNHMT2013, ASME 2013 4th International Conference on Micro/Nanoscale Heat and Mass Transfer, V001T09A001, December 11–14, 2013
Paper No: MNHMT2013-22003
DOI: https://doi.org/10.1115/MNHMT2013-22003
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Topics: Manufacturing, Microsensors, Temperature measurement, Sensors, Heat transfer, Heating, Q-factor, Temperature
Proceedings Papers

Ultrasensitive Bimaterial Cantilevers Optimized for Nanowire Heat Conduction Measurement

Carlo Canetta, Ning Gu, Arvind Narayanaswamy
Proc. ASME. MNHMT2012, ASME 2012 Third International Conference on Micro/Nanoscale Heat and Mass Transfer, 707-712, March 3–6, 2012
Paper No: MNHMT2012-75169
DOI: https://doi.org/10.1115/MNHMT2012-75169
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Topics: Cantilevers, Heat conduction, Nanowires, Aluminum coatings, Dimensions, Flat plates, Heat flux, Radiative heat transfer, Sensors, Silicon nitride ceramics
Proceedings Papers

Thermal Conductivity of Single-Crystal Silicon Microbridges Measured by Electrical Resistance Thermometry and Time-Domain Thermoreflectance

Timothy S. English, Leslie M. Phinney, Patrick E. Hopkins, Justin R. Serrano
Proc. ASME. MNHMT2012, ASME 2012 Third International Conference on Micro/Nanoscale Heat and Mass Transfer, 713-722, March 3–6, 2012
Paper No: MNHMT2012-75179
DOI: https://doi.org/10.1115/MNHMT2012-75179
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Topics: Crystals, Electrical resistance, Silicon, Temperature measurement, Thermal conductivity, Thermoreflectance, Temperature, Microelectromechanical systems, Modeling, Silicon-on-insulator
Proceedings Papers

Thermal Conductivity Measurement of Individual Polythiophene Nanofibers With Suspended Micro-Resistance Thermometer Devices

Sally A. McMenamin, Annie Weathers, Virendra Singh, Michael T. Pettes, Baratunde A. Cola, Li Shi
Proc. ASME. MNHMT2012, ASME 2012 Third International Conference on Micro/Nanoscale Heat and Mass Transfer, 723-728, March 3–6, 2012
Paper No: MNHMT2012-75276
DOI: https://doi.org/10.1115/MNHMT2012-75276
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Topics: Nanofibers, Thermal conductivity measurement, Thermometers, Thermal conductivity, Temperature, Adhesives, Binders (Materials), Conducting polymers, Density, Fibers
Proceedings Papers

Rapid Transient Thermal Analysis of Three-Dimensional Interconnect Structures Using Proper Orthogonal Decomposition Method

Banafsheh Barabadi, Satish Kumar, Yogendra K. Joshi
Proc. ASME. MNHMT2012, ASME 2012 Third International Conference on Micro/Nanoscale Heat and Mass Transfer, 729-733, March 3–6, 2012
Paper No: MNHMT2012-75286
DOI: https://doi.org/10.1115/MNHMT2012-75286
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Topics: Principal component analysis, Thermal analysis, Transients (Dynamics), Heating, Joules, Architecture, Copper, Electrical wires, Metals, Modeling
Proceedings Papers

Applications of Nano Hot-Film Sensor for Micro/Nanoscale Thermal Measurement

Koji Takahashi, Jun Hirotani, Takashi Nishiyama, Tatsuya Ikuta, Hiroshi Takamatsu
Proc. ASME. MNHMT2012, ASME 2012 Third International Conference on Micro/Nanoscale Heat and Mass Transfer, 677-681, March 3–6, 2012
Paper No: MNHMT2012-75030
DOI: https://doi.org/10.1115/MNHMT2012-75030
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Topics: Nanoscale phenomena, Sensors, Thermal conductivity, Carbon nanotubes, Contact resistance, Dielectrophoresis, Fins, Flow (Dynamics), Flow sensors, Fluids
Proceedings Papers

Assessment of Fourier-Based Thermal Models Used in Frequency-Domain Thermoreflectance Data Analysis

D. P. Sellan, V. Mishra, J. A. Malen, A. J. H. McGaughey, C. H. Amon
Proc. ASME. MNHMT2012, ASME 2012 Third International Conference on Micro/Nanoscale Heat and Mass Transfer, 683-686, March 3–6, 2012
Paper No: MNHMT2012-75087
DOI: https://doi.org/10.1115/MNHMT2012-75087
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Topics: Thermoreflectance, Phonons, Heat conduction, Relaxation (Physics), Temperature, Temperature profiles
Proceedings Papers

Thermoelectric Characterization of Ge 2 Sb 2 Te 5 Films for Phase-Change Memory

Jaeho Lee, Takashi Kodama, Yoonjin Won, Mehdi Asheghi, Kenneth E. Goodson
Proc. ASME. MNHMT2012, ASME 2012 Third International Conference on Micro/Nanoscale Heat and Mass Transfer, 687-693, March 3–6, 2012
Paper No: MNHMT2012-75092
DOI: https://doi.org/10.1115/MNHMT2012-75092
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Topics: Crystallization, Electromagnetic scattering, Engineering simulation, Film thickness, Grain boundaries, Optimization, Phase change materials, Radiation scattering, Scattering (Physics), Simulation
Proceedings Papers

Thermal Characterization of Discrete Device Layers in Al x Ga 1−x N Based Ultraviolet Light Emitting Diodes

Shweta Natarajan, Bobby G. Watkins, Vinod Adivarahan, Asif Khan, Samuel Graham
Proc. ASME. MNHMT2012, ASME 2012 Third International Conference on Micro/Nanoscale Heat and Mass Transfer, 695-705, March 3–6, 2012
Paper No: MNHMT2012-75146
DOI: https://doi.org/10.1115/MNHMT2012-75146
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Topics: Thermal characterization, Ultraviolet radiation, Temperature, Electroluminescence, Light-emitting diodes, Raman spectroscopy, Quantum wells, Reliability, Temperature measurement, Thermal management