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Proceedings Papers

Corrosion Behavior of X70 Pipeline Steel and Corrosion Rate Prediction Under the Combination of Corrosive Medium and Applied Pressure

Kaikai Li, Wei Wu, Guangxu Cheng, Yun Li, Haijun Hu, Hao Zhang

Proc. ASME. PVP2017, Volume 1B: Codes and Standards, V01BT01A036, July 16–20, 2017

Paper No: PVP2017-65651

DOI: https://doi.org/10.1115/PVP2017-65651

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Topics: Corrosion, Pipelines, Pressure, Steel, Carbon dioxide, Tension, Electrochemical impedance spectroscopy, Polarization (Electricity), Polarization (Light), Polarization (Waves)

Proceedings Papers

Experimentation and Adaptive Modeling for Temperature Effect Quantification in PVP Structural Health Monitoring With PWAS

Tuncay Kamas, Banibrata Poddar, Bin Lin, Lingyu Yu, Victor Giurgiutiu

Proc. ASME. PVP2015, Volume 6A: Materials and Fabrication, V06AT06A004, July 19–23, 2015

Paper No: PVP2015-45595

DOI: https://doi.org/10.1115/PVP2015-45595

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Topics: Modeling, Structural health monitoring, Temperature, Temperature effects, Waves, Sensors, Antiresonance, Boundary-value problems, Computer software, Elastic waves

Proceedings Papers

Development of a Testing System for Piezoelectric Wafer Active Sensors Exposed to Extreme Temperatures

William Roth, Banibrata Poddar, Jingjing Bao

Proc. ASME. PVP2015, Volume 6A: Materials and Fabrication, V06AT06A006, July 19–23, 2015

Paper No: PVP2015-45798

DOI: https://doi.org/10.1115/PVP2015-45798

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Topics: Semiconductor wafers, Sensors, Temperature, Testing, Electrodes, Design, Echoes, Electrical wires, Electrochemical impedance spectroscopy, Industrial furnaces

Proceedings Papers

Temperature Effects on Piezoelectric Wafer Active Sensors

Linlin Ma, Xiaoyi Sun, Bin Lin, Lingyu Yu

Proc. ASME. PVP2015, Volume 6A: Materials and Fabrication, V06AT06A007, July 19–23, 2015

Paper No: PVP2015-45841

DOI: https://doi.org/10.1115/PVP2015-45841

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Topics: Semiconductor wafers, Sensors, Temperature effects, Structural health monitoring, Storage, Temperature, Acoustic emissions, Durability, Electrochemical impedance spectroscopy, Ovens

Proceedings Papers

Analytical Model of Nuclear Environmental Effects With Piezoelectric Wafer Active Sensors

Bin Lin, Lingyu Yu, Victor Giurgiutiu, Matthieu Gresil, Adrian E. Mendez Torres

Proc. ASME. PVP2014, Volume 6A: Materials and Fabrication, V06AT06A004, July 20–24, 2014

Paper No: PVP2014-28887

DOI: https://doi.org/10.1115/PVP2014-28887

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Topics: Semiconductor wafers, Sensors, Structural health monitoring, Safety, Acoustic emissions, Durability, Electrochemical impedance spectroscopy, Failure, Irradiation (Radiation exposure), Modeling

NARROW

Corrosion Behavior of X70 Pipeline Steel and Corrosion Rate Prediction Under the Combination of Corrosive Medium and Applied Pressure

Experimentation and Adaptive Modeling for Temperature Effect Quantification in PVP Structural Health Monitoring With PWAS

Development of a Testing System for Piezoelectric Wafer Active Sensors Exposed to Extreme Temperatures

Temperature Effects on Piezoelectric Wafer Active Sensors

Analytical Model of Nuclear Environmental Effects With Piezoelectric Wafer Active Sensors

Journals

Conference Proceedings

eBooks

Resources

Opportunities

Corrosion Behavior of X70 Pipeline Steel and Corrosion Rate Prediction Under the Combination of Corrosive Medium and Applied Pressure

Experimentation and Adaptive Modeling for Temperature Effect Quantification in PVP Structural Health Monitoring With PWAS

Development of a Testing System for Piezoelectric Wafer Active Sensors Exposed to Extreme Temperatures

Temperature Effects on Piezoelectric Wafer Active Sensors

Analytical Model of Nuclear Environmental Effects With Piezoelectric Wafer Active Sensors

Journals

Conference Proceedings

eBooks

Resources

Opportunities

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