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Keywords: atomic force microscopy
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Journal Articles
Publisher: ASME
Article Type: Research Papers
J. Comput. Nonlinear Dynam. October 2011, 6(4): 041009.
Published Online: April 14, 2011
... information with nanoscale resolution. atomic force microscopy bifurcation cantilevers nonlinear dynamical systems numerical analysis The atomic force microscope (AFM) has become an important tool in micro- and nanoscale research since it was invented in the 1980s ( 1 ). A cantilever structure...
Journal Articles
Publisher: ASME
Article Type: Research Papers
J. Comput. Nonlinear Dynam. July 2011, 6(3): 031005.
Published Online: December 16, 2010
... of the microscale AFM cantilever probe are presented. While in previous studies, off-resonance excitation has been used to exploit subnanometer response amplitudes for noncontact atomic force microscopy ( 22 23 24 25 26 27 ), in this work off-resonance excitation is used to introduce nonlinear behavior...
Journal Articles
Publisher: ASME
Article Type: Research Papers
J. Comput. Nonlinear Dynam. October 2009, 4(4): 041009.
Published Online: August 25, 2009
..., or irregular system responses ( 15 ). As the predictability of the cantilever response is the foundation for imaging methods using atomic-force microscopy, these nonlinearities must be understood, compensated for if necessary, or exploited to the advantage of imaging if possible ( 16 ). The interactions...
Journal Articles
Publisher: ASME
Article Type: Research Papers
J. Comput. Nonlinear Dynam. April 2006, 1(2): 109–115.
Published Online: September 4, 2005
...Xiaopeng Zhao; Harry Dankowicz Tapping-mode atomic force microscopy has wide applications for probing the nanoscale surface and subsurface properties of a variety of materials in a variety of environments. Strongly nonlinear effects due to large variations in the force field on the probe tip over...