Thermal considerations in printed wiring board (PWB) assemblies are becoming increasingly important as packaging constraints shrink and power use escalates. In this paper, we provide a study on the potential for a genetic algorithm-driven PWB layout design tool to improve the thermal performance of such assemblies. As a case study, the thermomechanical fatigue of surface mounted leadless chip carriers on an FR4 epoxy board is used. We have found that by utilizing appropriate formula-based engineering approximations, the efficiency of parallel implementations of genetic algorithms in finding near-optimal and results makes this approach effective as an explorative “scouting” approach to identify promising board configurations for more computationally expensive evaluations such as finite element method.
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March 1999
Technical Papers
An Investigation of PWB Layout by Genetic Algorithms to Maximize Fatigue Life
A. J. Scholand,
A. J. Scholand
Advanced Electronic Packaging Laboratory, Manufacturing Research Center, 813 Ferst Drive, NW, Georgia Institute of Technology, Atlanta, GA 30332
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R. E. Fulton,
R. E. Fulton
Advanced Electronic Packaging Laboratory, Manufacturing Research Center, 813 Ferst Drive, NW, Georgia Institute of Technology, Atlanta, GA 30332
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B. Bras
B. Bras
System Realization Laboratory, George W. Woodruff School of Mechanical Engineering, Georgia Institute of Technology, Atlanta, GA
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A. J. Scholand
Advanced Electronic Packaging Laboratory, Manufacturing Research Center, 813 Ferst Drive, NW, Georgia Institute of Technology, Atlanta, GA 30332
R. E. Fulton
Advanced Electronic Packaging Laboratory, Manufacturing Research Center, 813 Ferst Drive, NW, Georgia Institute of Technology, Atlanta, GA 30332
B. Bras
System Realization Laboratory, George W. Woodruff School of Mechanical Engineering, Georgia Institute of Technology, Atlanta, GA
J. Electron. Packag. Mar 1999, 121(1): 31-36 (6 pages)
Published Online: March 1, 1999
Article history
Received:
January 7, 1995
Revised:
March 25, 1996
Online:
November 5, 2007
Citation
Scholand, A. J., Fulton, R. E., and Bras, B. (March 1, 1999). "An Investigation of PWB Layout by Genetic Algorithms to Maximize Fatigue Life." ASME. J. Electron. Packag. March 1999; 121(1): 31–36. https://doi.org/10.1115/1.2792658
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