Nanofabrication using arrays of modified atomic force microscopy (AFM) tips can drastically reduce feature sizes and increase data storage densities. Additionally, AFM experiments are valuable tools for characterizing the tribological properties of surfaces. In order to maximize the potential of nanofabrication techniques, it is necessary to understand fully the interactions between AFM tips and substrates, particularly when the latter is compliant and more damage-prone. To address this issue, we have carried out extensive molecular dynamics simulations of the nanotribological properties of self-assembled alkylsilane monolayers (SAMs) on amorphous silica with a realistic model of an AFM tip. Our simulations demonstrate that for fully physisorbed SAMs, even low load contacts can damage the SAM and cause material transfer to the probe tip. This effect, which is commonly ignored, can have a strong effect on the interpretation of experimental measurements. Partial chemisorption of the SAM lowers, but does not remove the possibility of damage.
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June 2010
Special Issue On Nanomanufacturing
Probe-Tip Induced Damage in Compliant Substrates
Michael Chandross,
Michael Chandross
Sandia National Laboratories
, Albuquerque, NM 87185
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Christian D. Lorenz,
Christian D. Lorenz
Department of Mechanical Engineering, Materials Research Group,
King’s College London
, London WC2R 2LS, UK
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Mark J. Stevens,
Mark J. Stevens
Sandia National Laboratories
, Albuquerque, NM 87185
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Gary S. Grest
Gary S. Grest
Sandia National Laboratories
, Albuquerque, NM 87185
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Michael Chandross
Sandia National Laboratories
, Albuquerque, NM 87185
Christian D. Lorenz
Department of Mechanical Engineering, Materials Research Group,
King’s College London
, London WC2R 2LS, UK
Mark J. Stevens
Sandia National Laboratories
, Albuquerque, NM 87185
Gary S. Grest
Sandia National Laboratories
, Albuquerque, NM 87185J. Manuf. Sci. Eng. Jun 2010, 132(3): 030916 (4 pages)
Published Online: June 14, 2010
Article history
Received:
December 15, 2008
Revised:
April 9, 2010
Online:
June 14, 2010
Published:
June 14, 2010
Citation
Chandross, M., Lorenz, C. D., Stevens, M. J., and Grest, G. S. (June 14, 2010). "Probe-Tip Induced Damage in Compliant Substrates." ASME. J. Manuf. Sci. Eng. June 2010; 132(3): 030916. https://doi.org/10.1115/1.4001660
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