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Pavel L. Komarov
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Proceedings Papers

Thermal Conductivity Measurements of Ultra-Thin Amorphous Poly(Methyl Methacrylate) (PMMA) Films

Ickchan Kim, Mihai G. Burzo, Pavel L. Komarov, Peter E. Raad
Proc. ASME. IMECE2013, Volume 8C: Heat Transfer and Thermal Engineering, V08CT09A071, November 15–21, 2013
Publisher: American Society of Mechanical Engineers
Paper No: IMECE2013-66507
https://doi.org/10.1115/IMECE2013-66507
View Paper titled, Thermal Conductivity Measurements of Ultra-Thin Amorphous Poly(Methyl Methacrylate) (PMMA) Films
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Topics: Thermal conductivity, Thermoreflectance, Thin films, Transients (Dynamics)
Proceedings Papers

Thermal Characterization of Pulse-Activated Microelectronic Devices by Thermoreflectance-Based Surface Temperature Scanning

Pavel L. Komarov, Mihai G. Burzo, Peter E. Raad
Proc. ASME. InterPACK2005, Advances in Electronic Packaging, Parts A, B, and C, 1413-1420, July 17–22, 2005
Publisher: American Society of Mechanical Engineers
Paper No: IPACK2005-73196
https://doi.org/10.1115/IPACK2005-73196
View Paper titled, Thermal Characterization of Pulse-Activated Microelectronic Devices by Thermoreflectance-Based Surface Temperature Scanning
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Topics: Microelectronic devices, Temperature, Thermal characterization, Thermoreflectance, Reflectance, Silicon, Transients (Dynamics), MOSFET transistors, Resolution (Optics), Calibration
Proceedings Papers

A Study of the Effect of Surface Metalization on the Thermal Conductivity Measurements by the Transient Thermo-Reflectance Method

Mihai G. Burzo, Pavel L. Komarov, Peter E. Raad
Proc. ASME. IMECE2002, Heat Transfer, Volume 2, 179-182, November 17–22, 2002
Publisher: American Society of Mechanical Engineers
Paper No: IMECE2002-32761
https://doi.org/10.1115/IMECE2002-32761
View Paper titled, A Study of the Effect of Surface Metalization on the Thermal Conductivity Measurements by the Transient Thermo-Reflectance Method
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Topics: Absorption, Semiconductors (Materials), Thermal conductivity, Thermoreflectance, Transients (Dynamics), Heat, Heat transfer, Lasers, Thin films, Top-tensioned risers
Journal Articles

A Study of the Effect of Surface Metalization on Thermal Conductivity Measurements by the Transient Thermo-Reflectance Method

Mihai G. Burzo, Pavel L. Komarov, Peter E. Raad
Journal: ASME Journal of Heat and Mass Transfer
Publisher: ASME
Article Type: Technical Papers
J. Heat Mass Transfer. December 2002, 124(6): 1009–1018.
https://doi.org/10.1115/1.1517265
Published Online: December 3, 2002
View Article titled, A Study of the Effect of Surface Metalization on Thermal Conductivity Measurements by the Transient Thermo-Reflectance Method
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Topics: Absorption, Heat, Heat transfer, Heating, Lasers, Temperature, Thermal conductivity, Thermoreflectance, Top-tensioned risers, Transients (Dynamics)
Journal Articles

A Fractional-Diffusion Theory for Calculating Thermal Properties of Thin Films From Surface Transient Thermoreflectance Measurements

Vladimir V. Kulish, Assistant Professor, ASME Associate Member, Jose´ L. Lage, Professor, Mem. ASME, Pavel L. Komarov, Research Fellow, Assoc. Mem. ASME, Peter E. Raad, Professor, Mem. ASME
Journal: ASME Journal of Heat and Mass Transfer
Publisher: ASME
Article Type: Technical Papers
J. Heat Mass Transfer. December 2001, 123(6): 1133–1138.
https://doi.org/10.1115/1.1416688
Published Online: May 4, 2001
View Article titled, A Fractional-Diffusion Theory for Calculating Thermal Properties of Thin Films From Surface Transient Thermoreflectance Measurements
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Topics: Diffusion (Physics), Gallium arsenide, Heating, Lasers, Temperature, Thermal conductivity, Thermal properties, Thermoreflectance, Thin films, Transients (Dynamics)